| | This article or section is missing citations or needs footnotes. Using inline citations helps guard against copyright violations and factual inaccuracies. (December 2007) | Automatic test equipment (ATE) is any automated device that is used to quickly test printed circuit boards, integrated circuits, or any other related electronic components or modules. Image File history File links Emblem-important. ...
Part of a 1983 Sinclair ZX Spectrum computer board. ...
An integrated circuit (IC) is a thin chip consisting of at least two interconnected semiconductor devices, mainly transistors, as well as passive components like resistors. ...
Nowadays, ATE devices are essentially always controlled by computers although in the past, custom-designed controllers or even relay controls were used. This article is about the machine. ...
Automotive style miniature relay A relay is an electrical switch that opens and closes under the control of another electrical circuit. ...
An ATE system can be as simple as a digital multi-meter (DMM) whose operating mode and measurements are controlled and analyzed by a computer, or as complex as a system containing dozens of complex test instruments capable of automatically testing and diagnosing faults in complex electronic systems, such as very sophisticated flying-probe testers. A digital multimeter A low cost digital multimeter An analog benchtop multimeter A multimeter or a multitester is an electronic measuring instrument that combines several functions in one unit. ...
ATE systems are used to test a wide range of electronic devices and systems, from simple components (resistors, capacitors, and inductors) to integrated circuits (ICs), printed circuit boards (PCBs), and complex, completely-assembled electronic systems. Resistor symbols (American) Resistor symbols (Europe, IEC) Axial-lead resistors on tape. ...
See Capacitor (component) for a discussion of specific types. ...
An inductor is a passive electrical device employed in electrical circuits for its property of inductance. ...
Integrated circuit of Atmel Diopsis 740 System on Chip showing memory blocks, logic and input/output pads around the periphery Microchips with a transparent window, showing the integrated circuit inside. ...
Part of a 1983 Sinclair ZX Spectrum computer board. ...
ATE is widely used in the electronic manufacturing industry to test electronics components and systems after they are fabricated. ATE is also used to test avionics systems on commercial and military aircraft. ATE systems are also used to test the electronic modules in today’s automobiles. ATE systems typically interface with an automated placement tool, called a Handler, that physically places the Device Under Test so that it can be measured by the equipment. Handler may refer to: Handler, one who handles something: Handler, a manager or controller of an animal Handler, a manager or controller of a sports player such as a boxer Handler, a manager or controller of a spy Baggage handler, a person who loads and unloads baggage and other cargo...
Device under test (DUT) is a term commonly used to refer to a manufactured product undergoing testing. ...
Over the past four decades, ATE has grown from specialized systems for electronics test applications to a wide range of applications in all facets of the electronics industry. Many ATE platforms used in the semiconductor industry output data using Standard Test Data Format (STDF). The semiconductor industry is the collection of business firms engaged in the design and fabrication of semiconductor devices. ...
Standard Test Data Format (STDF) is a file format for semiconductor test information originally developed by Teradyne, but now widely used throughout the semiconductor industry. ...
Typical vendors
Agilent Technologies (NYSE: A) (Agilent for short) is a measurement and instrument company headquartered in Santa Clara, California. ...
Advantest Corporation ) (TYO: 6857 , NYSE: ATE) is a large Japanese supplier of automatic test equipment. ...
Credence Systems Corporation is a manufacturer of test equipment for the global semiconductor industry. ...
HCL Technologies is one of the leading global technology and IT enterprises that offers product engineering, technology and application services, BPO, infrastructure services, IT hardware, systems integration, and distribution of technology and telecom products in India. ...
LTX (NASDAQ: LTXX) is an Automatic Test Equipment (ATE) vendor, founded in 1976 and headquartered in Norwood, MA (Greater Boston). ...
The National Instruments Campus in Austin, Texas National Instruments, or NI (NASDAQ: NATI), is a producer of automated test equipment and virtual instrumentation software. ...
Rohde & Schwarz (IPA: in German; anglicized pronunciation ) is an independent group of companies specializing in electronics. ...
Spea is a genus of North American amphibian commonly referred to as the wester nspadefoot toad. ...
Overview Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment (ATE) and interconnection systems. ...
Verigy Ltd is the semiconductor automatic test equipment business that was spun off from Agilent Technologies. ...
See also Back to Electronics A Tektronix model 475A portable analogue oscilloscope Electronic test equipment (sometimes called testgear) is used to create stimulus signals and capture responses from electronic Devices Under Test (DUTs). ...
The Hewlett-Packard Instrument Bus (HP-IB), is a short-range digital communications cable standard developed by Hewlett-Packard (HP) in the 1970s for connecting electronic test and measurement devices (e. ...
The Hewlett-Packard Instrument Bus (HP-IB), is a short-range digital communications cable standard developed by Hewlett-Packard (HP) in the 1970s for connecting electronic test and measurement devices (e. ...
The Semiconductor Test Consortium (STC) is a collaborative venture founded with the aim of driving the development of ATE standards throughout the entire test process, enabling ATE peripheral interface standards and encouraging closer working relationships between the semiconductor industry and the ATE development community. ...
External links - Semiconductor Test Consortium
- System Integration of an Open-Architecture Test System by Yuhai Ma, Advantest America Inc. (July 2006)
- ATE World
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