Channel reliability is given by where To is the channel total outagetime, Ts is the channel total scheduled time, and Ta is the channel total available time.
Reliability, validity and psychometric properties of the Greek translation of the zung depression rating scale Reliability, validity and psychometric properties of the Greek translation of the zung depression rating scale...
Reliability is an index of the consistency of measurements of...
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That is, the threshold voltage of such a device decreases rapidly at short channel lengths, thereby limiting the minimum usable length (the short-channel effect), but the threshold voltage does not increase very rapidly when the source potential is larger than the bulk potential, thereby improving the available dynamic range (the body effect).
The intrinsic dielectric reliability of the oxides described in Table 2 was determined by applying an elevated voltage at an elevated temperature to capacitor structures until dielectric failure was noted.
To summarize the reliability data, we have found that the improvement in n-FET hot-electron shift is directly related to the interfacial nitrogen concentration.
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