Failure analysis is the process of determining the cause of failure, collecting and analyzing data, and developing conclusions to eliminate the failure mechanism causing specific device or system failures. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of new products and for the improvement of existing products. Failure in general refers to the state or condition of not meeting a desirable or intended objective. ... This article needs to be cleaned up to conform to a higher standard of quality. ... Two digital voltmeters The field of electronics is the study and use of electronic devices that operate by controlling the flow of electrons or other electrically charged particles in devices such as thermionic valves and semiconductors. ...
This section lists the various types of equipment and techniques that are commonly used as part of the failure analysis process in the electronics industry. This list is not exhaustive.
A microscope (Greek: micron = small and scopos = aim) is an instrument for viewing objects that are too small to be seen by the naked or unaided eye. ... A surface acoustic wave (SAW) is a kind of wave used in piezoelectric devices called SAW devices in electronics circuits. ... Low temperature SEM magnification series for a snow crystal. ... A charged particle beam is a group of electrically charged particles that have approximately the same kinetic energy and move in approximately the same direction. ... Transmission electron microscopy (TEM) is an imaging technique whereby a beam of electrons is focused onto a specimen causing an enlarged version to appear on a fluorescent screen or layer of photographic film (see electron microscope), or can be detected by a CCD camera. ... The photoelectric effect is the emission of electrons from a surface (usually metallic) upon exposure to, and absorption of, electromagnetic radiation (such as visible light and ultraviolet radiation). ... A transmission line is the material medium or structure that forms all or part of a path from one place to another for directing the transmission of energy, such as electromagnetic waves or acoustic waves. ... Auger electron spectroscopy is an analytical technique in surface chemistry and materials science. ... An X-ray microscope uses electromagnetic radiation in the soft X-ray band to produce images of very small objects. ... Image of a small dog taken in mid-infrared (thermal) light (false color) Infrared (IR) radiation is electromagnetic radiation of a wavelength longer than visible light, but shorter than microwave radiation. ... An ion beam is a stream of charged particles, which has many uses in electronics manufacturing (principally ion implantation) and other industries. ...
Failure Mode and Effects Analysis (FMEA) is a method that examines potential product or process failures, evaluates risk priorities, and helps determine remedial actions to minimize the risk of the failure. ... Exponential failure density functions A failure rate is the average frequency with which something fails. ... Materials science includes those parts of chemistry and physics that deal with the properties of materials. ...
Bibliography
Martin, Perry L., Electronic Failure Analysis Handbook, McGraw-Hill Professional; 1st edition (February 28, 1999) ISBN 0070410445.
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